Model No:MTBE-39
Experimentation with Characteristics of TTL and CMOS
Experimentation with Characteristics of TTL and CMOS is a compact product designed to explain the fundamentals of Transistor–Transistor Logic (i.e. TTL) and Complementary Metal Oxide Semiconductor (i.e. CMOS), like Voltage Transfer Characteristics, Noise Margin and Gate Delay. Inbuilt Function Generator and DC supply is provided for ease of operation. The Voltage Transfer Characteristic of a logic gate is a graph between gate output voltage and gate input voltage. Noise margin is the voltage difference by which the signal exceeds the threshold voltage for Logic Low or Logic High. Gate delay is the span of time starting from the instant when the input to a logic gate becomes stable, to the time that the output of that logic gate becomes stable.
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** Note:-The content of the product and specification are subject to change without prior notice for continuous improvement. Images shown are for representation purpose only. “MICROTEKNIK” keeps the right to modify the content in the product without prior notice.